Elevate STEM Education & Material Research with Hitachi Benchtop SEM | Labware Group

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Elevate STEM Education & Material Research with Hitachi Benchtop SEM

Labware Analytical

27 Oct 2026

Require higher resolution than an optical microscope? 您的科研項目是否正需要比光學顯微鏡更高的解析度？

TM4000PlusIII / TM4000III

Scanning Electron Microscopes (SEM) | 電子顯微鏡

Providing material composition & topographical information / 為您提供極致清晰的材料微觀地形與成分資訊

Benchtop Compact & Low Running Costs
桌上型緊湊設計及低運作成本
Wide Area Image Acquisition
大面積影像獲取
High-Resolution Imaging
高解析度成像
Recipe function to execute operation automatically
自動化程序執行
Collect both BSE and SE signals at the same time
同步背向散射電子與二次電子訊號擷取
Full EDS mapping
全功能 EDS 元素圖譜

Backscatter Electron (BSE)

背向散射電子

Secondary Electron (SE)

二次電子

https://www.youtube.com/watch?v=P0V6B_HhIzA

Diverse Applications

廣泛的應用領域

Biology 生物學 Abalone shell 鮑魚殼 Butterfly Wing 蝴蝶翅膀	Materials 材料科學 Photocatalyst Fiber 光觸媒纖維 Hydrogel Storage Alloy 水凝膠儲氫合金
Environment 環境檢測 PM 2.5 Volcanic Ash 火山灰顆粒	Food 食品科學 Mold that Grew on Bun 麵包黴菌 Corn Starch 玉米澱粉
Healthcare 醫療保健 Dental Floss 牙線纖維 Headache Remedy Tablet 止痛藥片

To learn more about Hitachi Scanning Electron Microscope (SEM), please contact us via email or tel (+852 6113 6936)

如欲查詢日立電子顯微鏡詳情，請透過電郵或致電 +852 6113 6936 聯絡我例們。

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