Product Advantage
Thermal diffusivity range: 0.01mm2/s to 1000mm2/s
Heating/Cooling Rate: 0.01 up to 10K/min
Pulsewidth: 5nm (optional 1ns)
Measurement under vacuum possible
 
 
Product Details
Based on the well established Laser Flash technique, the LINSEIS “Thin-Film-Laserflash” offers a whole range of new possibilities to analyze thermophysical properties of thin films from 80nm up to 20um thickness.
Here, ‘High Speed Laserflash Method’ is applied. The reflectivity is measured with respect to time, and the data received can be matched to a model which contains coefficients that correspond to thermal properties.
 
Another technique can be applied is ‘Time Domain Thermoreflectance Method’.
This can be applied to thin layers on non-transparent substrates.
The thermal diffusivity of the sample layer can be calculated by using falling edge of the normalized temperature rise in combination with a multilayer model developed by LINSEIS in cooperation with Prof. David G. Cahill of the University of Illinois.

For more information, please visit
https://www.linseis.com/en/products/thin-film-analyzer/tf-lfa-laser-flash-for-thin-films/